Charge states distributions of lead ions in Al and Cu
نویسندگان
چکیده
منابع مشابه
Charge states of ions, and mechanisms of charge ordering transitions.
To gain insight into the mechanism of charge ordering transitions, which conventionally are pictured as a disproportionation of an ion M as 2M(n+)→M((n+1)+) + M((n-1)+), we (1) review and reconsider the charge state (or oxidation number) picture itself, (2) introduce new results for the putative charge ordering compound AgNiO2 and the dual charge state insulator AgO, and (3) analyze the cationi...
متن کاملapplication and construction of carbon paste modified electrodes developed for determination of metal ions in some real samples
ساخت الکترودهاِی اصلاح شده ِیکِی از چالشهاِی همِیشگِی در دانش شیمِی بوِیژه شیمِی تجزیه مِی باشد ،که با در نظر گرفتن سادگِی ساخت، کاربردی بودن و ارزان بودن روش مِی توان به باارزش بودن چنِین سنسورهاِی پِی برد.آنچه که در ادامه آورده شده به ساخت و کاربرد الکترودهاِی اصلاح شده با استفاده از نانو ذرات در اندازه گِیرِی ولتامترِی آهن وکادمِیم اشاره دارد. کار اول اختصاص دارد به ساخت الکترود خمِیر کربن اصلاح شده با لِیگاند داِ...
15 صفحه اولaccumulation of heavy metals (cu, zn, cd and pb) in sediment and selected organisms in lukut river, negrisembilan, malaysia, and toxocological studies of heavy metals (cu, zn, cd and pb) on penaeus monodon (fabricius, 1798) juveniles
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15 صفحه اولRange Distributions of Low-energy Nitrogen and Oxygen Ions in Silicon (RESEARCH NOTE)
The range distributions of low-energy nitrogen and oxygen (2-3 keV) ions is silicon are measured and compared with these available in theories. The nitrogen distribution is very close to a Gaussian distribution as predicted by theory. The oxygen profile however, indicates a surface localized peak along with a shoulder and a long tail into the sample. The surface peak is beleived to he the resul...
متن کاملINTERFACIAL ELECTRONIC CHARGE TRANSFER AND DENSITY OF STATES IN SHORT PERIOD Cu/Cr MULTILAYERS
Nanometer period metallic multilayers are ideal structures to investigate electronic phenomena at interfaces between metal films since interfacial atoms comprise a large atomic fraction of the samples. The multilayers studied were fabricated by magnetron sputtering and consist of bilayers from 1.9 nm to 3.3 nm. X-ray diffraction, cross-section TEM and plan-view TEM show the Cu layers to have a ...
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ژورنال
عنوان ژورنال: Results in Physics
سال: 2016
ISSN: 2211-3797
DOI: 10.1016/j.rinp.2016.08.009